Photo by Franceso DRIUSSI
ICMTS in General
The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.
It usually takes place in late March or early April and the location rotates between Japan, Europe, and the United States.
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Call for Papers
ICMTS 2027 Timeline
| Apr-Oct, 2026 | Authors prepare their abstracts |
| Oct, 2026 | Abstract uploads begin |
| Nov 01, 2026 | Abstract submission deadline |
| Jan 15, 2027 | Authors notified of acceptance |
| Apr 05-08, 2027 | ICMTS 2027 |
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ICMTS Technical Sponsors:
ICMTS Exhibitors/Patrons: 
