Photo by Hans TUINHOUT​

IEEE International Conference on Microelectronic Test Structures

About ICMTS

The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions. The location rotates between Japan, Europe, and the United States. The meeting is an IEEE technically sponsored conference, sponsored by the IEEE Electron Devices Society.

Several dozen subject matter experts from around the world volunteer their time to be members of the Technical Program Committee (TPC), which includes reviewing the abstracts submitted for publication. Each year’s conference is organized by a group of volunteers from the TPC. The Steering Committee manages the conference and assists that year’s organizing committee.

ICMTS Permanent Steering Committee

Chair, 班長

Yoshio MITA
The University of Tokyo

European Representative

Carlo CAGLI
STMicroelectronics N.V.

Asian Representative

Tatsuya OHGURO
Toshiba Electric Devices & Storage Corporation

North American Representative

Brad SMITH
BeeSmith, LLC

European Representative

Stewart SMITH
The University of Edinburgh

North American Representative

Larg WEILAND
PDF Solutions, Inc.

ICMTS 2026 Organizing Committee

General Chair

Yuzo FUKUZAKI
Rapidus US, LLC, USA

Technical Program Chair

Kejun XIA
TSMC

Technical Program Chair

Tatsuya OHGURO
Toshiba Electric Devices & Storage Corporation

Tutorial Chair

Takayuki MORI
Kanazawa Institute of Technology

Exhibition Chair

Jun TANIGUCHI
Keysight Technologies, Japan

Local Arrangements

Jun TANIGUCHI
Keysight Technologies, Japan

Web Support

Brad SMITH
BeeSmith, LLC

Web Support

Larg WEILAND
PDF Solutions, Inc.


ABOUT THE SITE

 ICMTS Technical Sponsors:

 ICMTS Exhibitors/Patrons:
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